ALX Series Datasheet

Requirement:

As Spec.

Test Method:

MIL-STD-202 Method 304; +25/-55/+25/+125/+25°C

Requirement:

ΔR ±0.5

Test Method:

Actual power handling capability is limited by the end user mounting process. As with any high power chip resistor the ability to remove the heat is critical to the overall performance of the device

Requirement:

>9999MΩ

Test Method:

MIL-STD-202 Method 302; Apply 100VDC for 1 minute

Requirement:

ΔR ±1

Test Method:

MIL-STD-202 Method 108A; 70 ±2°C, RCWV for 1000 hrs with 1.5 hrs “ON” and 0.5 hrs “OFF”

Requirement:

ΔR ±0.4

Test Method:

MIL-STD-202 Method 103B; 40 ±2°C, 90~95% R.H. RCWV for 1000 hrs with 1.5 hrs “ON” and 0.5 hrs “OFF”

Requirement:

95% min.coverage

Test Method:

MIL-STD-202 Method 208H; 245 ±5°C for 3 seconds

Requirement:

ΔR ±0.2

Test Method:

MIL-STD-202 Method 210E; 260 ±5°C for 10 seconds

Requirement:

ΔR ±0.2

Test Method:

JIS-C-5201 1 4.36; 1 hour, -65°C, followed by 45 minutes of RCWV

Requirement:

ΔR ±0.2

Test Method:

0MIL-STD-202 Method 108; At +155°C for 1000hrs

Requirement:

ΔR ±0.2

Test Method:

MIL-STD-202F Method 107G; -55°C ~ 155°C, 100 cycles